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Month XX, 20XX
 
Gifts and donations this holiday season
Merry Christmas and happy holidays. In a nice gesture, several companies are forgoing cards or gifts this year and are making holiday donations to charities. If your organization is making donations, let me know what charities you are supporting. EDN and T&MW readers might want to join you. More
 
A D V E R T I S E M E N T

Non-Intrusive Board Test: New Technologies for Validation and Test within Design and Manufacturing
Non-intrusive board test (NBT) is a software-driven methodology for validation and test within design and manufacturing. NBT strategies can employ several technologies, such as boundary scan (IEEE 1149.1/JTAG), processor-controlled test (PCT) and built-in self test (BIST). Deploying multiple technologies in a unified environment improves validation results and test coverage over legacy strategies. The results are functionally validated boards in design and higher test coverage, faster test times and greater yields in manufacturing. View today, click here!
 
EMC 2011: Paper deadline approaching
January 15, 2011 is the deadline for submitting technical papers for the 20111 IEEE EMC Symposium. More
 
Optical transceiver tests verify compliance
You need a specification and test strategy to ensure all the components in an optical communications system meet system-level requirements. Eye-mask tests can indicate where optical signal losses will lead to data errors. More
 
A D V E R T I S E M E N T

Fast S-parameter Measurement for Signal Integrity Engineers
The use of s-parameters to characterize connectors, cables, backplanes and devices has increased in recent years. Traditionally, instruments such as vector network analyzers (VNA) have been used for such measurements. Efforts to use time domain instruments such as TDR/TDT do not completely address the complexity issue and suffer from limited dynamic range and bandwidth. This webinar introduces a new time domain method which combines the speed and low cost of TDR/TDT measurements with the range and accuracy of a VNA. View today, click here!
 
NI expands PXI Express chassis line
The new PXIe-1078 nine-slot chassis features a total system bandwidth of 1 Gbyte/s; for the new PXIe-1071 four-slot chassis, total system bandwidth is 3 Gbytes/s. Both accept a four-slot wide embedded controller in one slot. More
 
LeCroy analyzer works with Tektronix, Agilent scopes
The enhanced connectivity of the LeCroy LogicStudio 16-channel logic analyzer enables users of scopes ranging from 40 MHz up to 1 GHz to turn their PCs into mixed-signal oscilloscopes. More
 
A D V E R T I S E M E N T


 
Take a challenge, win $100
Answer one of our December challenge questions correctly, and you could win a $100 American Express gift card. Challenges cover oscilloscopes and data acquisition. More
 
Industry calendar of events
Upcoming events include OFC/NFOEC (March), the Measurement Science Conference (March), and IPC APEX (April). For more information about these and other test-related events, visit our online calendar. More
 
 
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